Kapran, A; Hippler, R; Wulff, H; Olejnicek, J; Pisarikova, A; Cada, M; Hubicka, Z:Characteristics of a pulsed hollow cathode discharge operated in an Ar+O2 gas mixture and deposition of copper nickel oxide thin films,Vacuum 215112272(2023).
Krajczewski, J; Michalowska, A; Ctvrtlik, R; Nozka, L; Tomastik, J; Vaclavek, L; Turczyniak-Surdacka, S; Bienskowski, K; Solarska, R:The battle for the future of SERS - TiN vs Au thin films with the same morphology,Appl. Surf. Sci. 618156703(2023).
Barasinski, A; Perina, J; Cernoch, A:Quantification of Quantum Correlations in Two-Beam Gaussian States Using Photon-Number Measurements,Phys. Rev. Lett. 130(4)43603(2023).
Arkhipov, II; Minganti, F:Emergent non-Hermitian localization phenomena in the synthetic space of zero-dimensional bosonic systems,Phys. Rev. A 107(1)12202(2023).